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MIC-B20 student’s microscope

Magnification:  40X  ~ 1600X Objective:  4X  10X  40X,100X
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MIC-DM tool microscope

MIC TECH’S MIC-DM is new digital measurement microscope. Mainly used in manufacturing department, Measuring and testing room for components dimension test.LED illumination, calculator with two axis or three axis, full accessory for you to choose. Offer sub-micron precision test, excellent performance is best choice for your high quality components, integrated circuit three dimensional test. Even fresh man can operate this microscope very easily. Manual stage with high-resolution linear encoder makes fast and accurate measurement zoom ratio 7:1 high quality lens high resolution camera share and clear image transmitting, oblique illumination, and coaxial illumination
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MIC-DS mono continuous zoom microscope

Magnification: 0.7X-4.5X High-quality effect of coaxial illumination, contrast, definition and depth of field are outstanding In addition to equipped with coaxial illumination, also can equipped with LED ring illuminator Specially used for inspect & measure bottom of small deep hole, defect of LCD, plane press works and other plane objects with high reflectivity & low reflectivity simultaneously.
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MIC-F student’s microscope

Student's microscope 40-1600x magnification fully coated optical system. Mechanicel Tube length 160mm Compensation Free Binocular Head, Interpupilary Distance 55-75mm, 360°Rotatable Coaxial Coarse and Fin Focus Adjustment:Range 12MM,Division fo Fine Focus Adjustment 0.002MM Focusing Stop to Prevent Objectives & Slides from Damaging Rack and pinion Adjustment for Condenser Built-in Illumination, Adjustable Brightness Power Supply 110V or 220V, CE Approval A Wide Range of Accessories to be Equipped with this Microscope for multi-purpose
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MIC-F4 student’s microscope

Student's microscope 40-1600x magnification fully coated optical system. Mechanicel Tube length 160mm Compensation Free Binocular Head, Interpupilary Distance 55-75mm, 360°Rotatable Coaxial Coarse and Fin Focus Adjustment:Range 12MM,Division fo Fine Focus Adjustment 0.002MM Focusing Stop to Prevent Objectives & Slides from Damaging Rack and pinion Adjustment for Condenser Built-in Illumination, Adjustable Brightness Power Supply 110V or 220V, CE Approval A Wide Range of Accessories to be Equipped with this Microscope for multi-purpose
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MIC-F6 student’s microscope

Student's microscope 40-1600x magnification fully coated optical system. Mechanicel Tube length 160mm Compensation Free Binocular Head, Interpupilary Distance 55-75mm, 360°Rotatable Coaxial Coarse and Fin Focus Adjustment:Range 12MM,Division fo Fine Focus Adjustment 0.002MM Focusing Stop to Prevent Objectives & Slides from Damaging Rack and pinion Adjustment for Condenser Built-in Illumination, Adjustable Brightness Power Supply 110V or 220V, CE Approval A Wide Range of Accessories to be Equipped with this Microscope for multi-purpose
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MIC-F8 student’s microscope

Student's microscope 40-1600x magnification fully coated optical system. Mechanicel Tube length 160mm Compensation Free Binocular Head, Interpupilary Distance 55-75mm, 360°Rotatable Coaxial Coarse and Fin Focus Adjustment:Range 12MM,Division fo Fine Focus Adjustment 0.002MM Focusing Stop to Prevent Objectives & Slides from Damaging Rack and pinion Adjustment for Condenser Built-in Illumination, Adjustable Brightness Power Supply 110V or 220V, CE Approval A Wide Range of Accessories to be Equipped with this Microscope for multi-purpose
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MIC-F9 student’s microscope

Student's microscope 40-1600x magnification fully coated optical system. Mechanicel Tube length 160mm Compensation Free Binocular Head, Interpupilary Distance 55-75mm, 360°Rotatable Coaxial Coarse and Fin Focus Adjustment:Range 12MM,Division fo Fine Focus Adjustment 0.002MM Focusing Stop to Prevent Objectives & Slides from Damaging Rack and pinion Adjustment for Condenser Built-in Illumination, Adjustable Brightness Power Supply 110V or 220V, CE Approval A Wide Range of Accessories to be Equipped with this Microscope for multi-purpose
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MIC-FEM8000F field emission scanning electron microscope

MIC-FEM8000F field emission scanning electron microscope Schottky Schottky field emission electron gun of high brightness, good single color,small electron beam spot size, long life Low acceleration voltage to maintain good brightness and higher resolution High beam stability, the dispersion is small, suitable for a variety of long accurate analysis, such as BSE, EDS, EBSD Low acceleration voltage of non-conductive samples can be directly observed without spraying Variety of automatic functions, operation is very simple, using only the mouse to complete all of the electron microscope operation
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MIC-FEM8100F field emission scanning electron microscope

Advantage and Cases Scanning electron microscopy (sem) is suitable for the observation of the surface topography of metals, ceramics, semiconductors, minerals, biology, polymers, composites and nano-scale one-dimensional, two-dimensional and three-dimensional materials (secondary electron image, backscattered electron image).It can be used to analyze the point, line and surface components of microregion.It is widely used in petroleum, geology, mineral field, electronics, semiconductor field, medicine, biology field, chemical industry, polymer material field, criminal investigation of public security, agriculture, forestry and other fields.
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MIC-HL tool microscope

More accurate step measurement no Segment difference sharp and excellent surface checking Good illumination which can be applied to different working environment Deep and large field of view Color CCD camera Digital image storage
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MIC-JB precision measuring microscope

MIC-JB precision measuring microscope is a small size Two-dimensional measuring instrument with digital display,it is compact structure,imaging clearly and high precision.It adopts reflected and transmitted illumination,observe,analyze and measure the geometric sense of precision work piece through observation and digital display system.The microscope is wildly used in measuring room,produce line and department of research institutions,etc.Two-dimensional measuring software is available for your selection,for some geometric parameters which is difficult to measure directly,such as circle,arc,coaxial,parallel,crossing,relation of shape & position and virtual dimension,etc,it can get the result and output report automatically and quickly.
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