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MX1000 Inverted Metallurgical Microscope
MX-1000 big inverted metallurgical microscope has wide field eyepieces and simple polarization observation device, the Kohler illuminator is used in the transmitted and reflected illuminating system, the whole field is clear and uniformity. It is suitable for inspecting, such as semiconductor silicon wafer, LCD floor plate, electrocircuit plate, solid powder and all kind of industry sample that translucent or opaque. It is the ideal instruments in research work in biology, metallography, mineralogy, precision engineering, electronics, etc.
Features
- Adopt infinity optical system and modularization function design.
- Long W.D bright or dark field plan objectives (no cover glass), the field of view is widely and clear.
- Wide-field plan eyepieces: field number Ф22mm.
- Coaxial coarse/fine focus system, with tensional adjustable and up stop, minimum division of fine focusing: 2μm.
MX200 Inverted Metallurgical Microscope
MX200 inverted metallurgical microscope has wide field eyepieces and simple polarization observation device, the Kohler illuminator is used in the transmitted and reflected illuminating system, the whole field is clear and uniformity. It is suitable for inspecting, such as semiconductor silicon wafer, LCD floor plate, electrocircuit plate, solid powder and all kind of industry sample that translucent or opaque. It is the ideal instruments in research work in biology, metallography, mineralogy, precision engineering, electronics, etc.
Features
- Adopt infinity optical system and modularization function design.
- Long W.D bright or dark field plan objectives (no cover glass), the field of view is widely and clear.
- Wide-field plan eyepieces: field number Ф22mm.
- Coaxial coarse/fine focus system, with tensional adjustable and up stop, minimum division of fine focusing: 2μm.
NC-117M comparison microscope
NC-117M comparison microscope is a device used to analyze side-by-side specimens. It consists of two microscopes connected to an optical bridge, which gives you the choice of four different observation modes: full right image, full left image, split-image comparison and overlapping mode. NC - 117M comparison microscope is designed for identifying objects structure, comparing similarities and differences between specimens, such as pathological slides, biological slides and so on. It is an ideal instrument for teaching、biological and medical field.
NDX-1 Transmission type centering error inspection system
NDX-1 Transmission type centering error inspection system
This microscope is designed for centering of test lenses.
Capable to read with high accuracy for centering of doublet lenses and direction of gap in decentering.
This model is developed having a wider measuring range and easier adjustment in the collimator lens.
And test all lens with focus distance from -200-+500mm, best choice for optial lens processing and calibration on concentricity deviation between the optical axis of spherical lens and external circle.
NFX-2A Reflection type centering error inspection system
NFX-2A Reflection type centering error inspection system
Description:
This microscope is designed for centering of test lenses.
Capable to read with high accuracy for centering of doublet lenses and direction of gap in decentering.
This model is developed having a wider measuring range and easier adjustment in the collimator lens.
NJ portable microscope
NJ portable microscope
Portable Measuring Microscope
It is widely used in spot inspecting and measuring in the factory and observation and research in Laboratory. It is especially suitable for production locale inspecting for mechanical, paper making manufacture and print, textile industry, etc. This product is small and exquisite, good designed and exquisite, with easy operation, also suitable for student’s experiment.
