MIC-EM81 Series High Resolution Field Emission Scanning Electron Microscope

MIC-EM81 Series High Resolution Field Emission Scanning Electron Microscope with new electron optical designs such as lens barrel acceleration technology and low-aberration conical objective lens. It achieves sub-nanometer imaging at low voltage, has broad applicability to various materials, and can meet the testing needs of various scientific research and industrial fields. Field emission gun electron microscope High resolution field emission scanning electron microscope Ultra-high resolution field emission scanning electron microscope