MIC-EM82 Series Ultra-high Resolution Field Emission Scanning Electron

MIC-EM82 Series Ultra-high Resolution Field Emission Scanning Electron Microscope with new electro-optical design. It is based on the deceleration sample stage, a new generation of low aberration objective lens, Inlens detector and other technologies, and integrates extensive image processing functions, which provides new solutions for users in new energy, semiconductor and other industries.