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MIC-Z12 0.8-10X stereo microscope
zoom main body 0.8～10X,zoom ratio 12.5：1 parallel optical system
Coaxial coarse and fine focus, precision to 0.002mm, easy to focus on perfect image
Tilting head, release user’s fatiguefrom long time operation, titling angle from 5°～45°
Aperture diaphragmis applied on the stereo microscope, for different sample, users can take different aperture diaphragm.
Cold fiber light, light can be changed according to customer’s application
Base part with one piece of diffuse flat plate reflector, 360° rota table, transmitting light can be changed to reflecting light by using this diffuse flat plate reflector.
MIC-Z6 0.67-4.5X stereo microscope
Zoom objective：0.67X-4.5X
MIC-Z6 series zoom stereo microscope providing high-quality, durable and reliable optical system and operating mechanism. New design show the best resolution and true color images, to meet the modern biomedical research, modern electronics industry online testing and other technology industries such as high-precision requirements
MIC-Z6 serials addtional objective
MIC-Z6 serials stereo microscope 2X addtional objective working distance:26mm
MIC-Z6 serials stereo microscope 1.5X addtional objective working distance:47mm
MIC-Z6 serials stereo microscope 0.75X addtional objective working distance:117mm
MIC-Z6 serials stereo microscope 0.7X addtional objective working distance:120mm
MIC-Z6 serials stereo microscope 0.5X addtional objective working distance:177mm
MIC-Z6 serials stereo microscope 0.3X addtional objective working distance:287mm
interface screw diameter 48mm
MIC-ZFA 2010 measurement microscope
MIC-ZFA 2010 measurement microscope with split-image function is independently developed by our company. It is based on image measurement principle, uses detection of optical focal point method to do non-contact height difference measurement. It can not only observe surface states of measured point, but also carry out measurement for height, depth and height difference. This instrument also has ability to observe light and dark file, polarized light, so it is particularly suitable to be used to observe height difference with very little gap、inclusion、protuberance and very little scratches.
This product is applicable to detection and observation for silicon wafer、IC、LCD、TFT、PCB、MEMS laser processing、wafer testing、semiconductor material、wiring hardness etching、LCD battery cover、wiring frame product etc.
