MIC-MX12 automatic wafer inspection microscope

MIC TECH’s newly launched MIC-MX12 model five axis full-automatic wafer inspecition microscope is specially designed for large scale electronic component, wafer, epistar, semi-conductor quality checking. With full function such as bright field, dark field, DIC, simple polorizing and other methods, gurantee your high resolution image with sharp contrast. The following is FULL AUTO MIC TECH AWL wafer system based on MIC-MX12 model