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MIC-MX12 automatic wafer inspection microscope
MIC TECH’s newly launched MIC-MX12 model five axis full-automatic wafer inspecition microscope is specially designed for large scale electronic component, wafer, epistar, semi-conductor quality checking. With full function such as bright field, dark field, DIC, simple polorizing and other methods, gurantee your high resolution image with sharp contrast. The following is FULL AUTO MIC TECH AWL wafer system based on MIC-MX12 model
MIC-ZFA 2010 measurement microscope
MIC-ZFA 2010 measurement microscope with split-image function is independently developed by our company. It is based on image measurement principle, uses detection of optical focal point method to do non-contact height difference measurement. It can not only observe surface states of measured point, but also carry out measurement for height, depth and height difference. This instrument also has ability to observe light and dark file, polarized light, so it is particularly suitable to be used to observe height difference with very little gap、inclusion、protuberance and very little scratches.
This product is applicable to detection and observation for silicon wafer、IC、LCD、TFT、PCB、MEMS laser processing、wafer testing、semiconductor material、wiring hardness etching、LCD battery cover、wiring frame product etc.
NJ portable microscope
NJ portable microscope
Portable Measuring Microscope
It is widely used in spot inspecting and measuring in the factory and observation and research in Laboratory. It is especially suitable for production locale inspecting for mechanical, paper making manufacture and print, textile industry, etc. This product is small and exquisite, good designed and exquisite, with easy operation, also suitable for student’s experiment.
BJ portable metallurgical microscope
MIC TECH BJ-A/BJ-B model is a portable metallurgical microscope, but a little bit different. When metal and alloy which needs to be distinguished but unable to make samples to be used in the on-the-spot material is appraised live, this machine can carry on analysis and research on the metal material in the metallographic testing, and the analytic work of metallographic. It can also be applied to jade article, pottery, bronze ware surface observation of institutional framework analysis. This instrument adopts LED to light vertically, does not need 220V alternating current source, uses lightly and safely for users, hours continuously lighting, long service time. The LED light rises warmly. Very small in size, low heat for safe use.
This instrument can dispose CCD digital camera, digital camera, but convenient picture gathered, kept, imported at the scene is analyzed and researched.
Stereo 1X dust cover lens
Specification
Magnification: 1X
Mounting Thread: 1-7/8" M48 M42 M50
Suit Microscope: MIC TECH continuous serials stereo microscope and Olympus Microscope
1X auxiliary objective lens for microscopes.
1-7/8" (M48, 48mm) M42 M50 mounting thread and goes with MIC TECH series and Olympus stereo microscopes.
