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Interference Microscope 6JA
Interference Microscope 6JA
Use:
This instrument is used to measure the workpiece surface finish, or coating of groove depth. With accessories, but also granular measurement, patterns of chaos and low-reflectivity surface, while the apparatus placed in the workpiece, the surface of the large-scale measurements.
Specifications:
Uneven depth measurement range: 0.03-1μm（▽10～▽14）
Work objective lens numerical aperture: 0.65
Work distance: 0.5mm
Field of view: Visual Φ0.25mm Photo 0.21×0.15mm
Magnifications: Visual 500× Photo 168×
Micrometer drum reticle value: 0.01mm
MIC-JB precision measuring microscope
MIC-JB precision measuring microscope is a small size Two-dimensional measuring instrument with digital display,it is compact structure,imaging clearly and high precision.It adopts reflected and transmitted illumination,observe,analyze and measure the geometric sense of precision work piece through observation and digital display system.The microscope is wildly used in measuring room,produce line and department of research institutions,etc.Two-dimensional measuring software is available for your selection,for some geometric parameters which is difficult to measure directly,such as circle,arc,coaxial,parallel,crossing,relation of shape & position and virtual dimension,etc,it can get the result and output report automatically and quickly.
MIC-600 Multi-functional precision measuring microscope
MIC-600 Multi-functional precision measuring microscope is developed and aimed at the semiconductor industry,Silicon wafer manufacturing industry,electronic information industry,metallurgical industry.As an advanced precision measuring microscope,it can be used to identify,analyze and measure structure of a variety of metal,alloy and also for detecting the semiconductor,LCD,TFT,PDP and solar cell panel.
The ergonomics design makes you feel comfortable.
MIC-TZ1A Eccentricity testing microscope
MIC-TZ1A Eccentricity testing microscope
Internal focusing transmission type centering error inspection system
This microscope is designed for centering of test lenses.
Capable to read with high accuracy for centering of doublet lenses and direction of gap in decentering.
This model is developed having a wider measuring range and easier adjustment in the collimator lens.
Internal focusing transmission type centering error inspection system
This microscope is designed for centering of test lenses.
Use: Can be used to check all kinds of lens which focus is from 5-500mm, good instrument for optical lens making, used for assembly calibrating, test for coaxial deviation between the sphere lens optical axis with the out sphere, especially good for short focus distance hign level lens.
NFX-2A Reflection type centering error inspection system
NFX-2A Reflection type centering error inspection system
Description:
This microscope is designed for centering of test lenses.
Capable to read with high accuracy for centering of doublet lenses and direction of gap in decentering.
This model is developed having a wider measuring range and easier adjustment in the collimator lens.
NDX-1 Transmission type centering error inspection system
NDX-1 Transmission type centering error inspection system
This microscope is designed for centering of test lenses.
Capable to read with high accuracy for centering of doublet lenses and direction of gap in decentering.
This model is developed having a wider measuring range and easier adjustment in the collimator lens.
And test all lens with focus distance from -200-+500mm, best choice for optial lens processing and calibration on concentricity deviation between the optical axis of spherical lens and external circle.
MIC-WM10 digital microscope system
MIC-WM10 digital microscopy system
Compared with the traditional optical microscope, MIC-WM10 digital microscopy system using high performance optical device and a CCD camera, can be observed on the display screen vivid color images; because the use of digital technology, you can easily make use of the computer and network platform digitizing sample observation, measurement, and processing, etc.
MIC-JX14B1 digital large scale toolmaker’s microscope
MIC-JX14B1 digital large scale toolmaker’s microscope
Characteristics:
- The photoelectrical technique is adopted, with a precision grating rule as a measurer for X- and Y- axis as a measurer, with readings direct-viewing and testing convenient.
- The integral digital display box is installed in front of the base frame, consisting of a unified entity with the mainframe; with a simple system easy to operate
- With multiple eyepieces and objectives, the main microscope has a large scope of view field with clear image formation
- The main microscope can oscillate left and right, suitable for the measurement for spiral pats.
- LED-luminotron lighting is adopted for transmission and indirect lighting, with low heating power and long life.
- High speed and micro-motion devices are adopted which can be switched over quickly.
- The tailstock rack is installed to measure the axel-type parts
- Multiple accessories are provided, with extensive uses.
MIC-JX14B digital large scale toolmaker’s microscope
MIC-JX14B digital large scale toolmaker’s microscope
Characteristics:
- The photoelectrical technique is adopted, with a precision grating rule as a measurer for X- and Y- axis as a measurer, with readings direct-viewing and testing convenient.
- With multiple eyepieces and objectives, the main microscope has a large scope of view field with clear image formation
- The main microscope can oscillate left and right, suitable for the measurement for spiral pats.
- LED-luminotron lighting is adopted for transmission and indirect lighting, with low heating power and long life.
- High speed and micro-motion devices are adopted which can be switched over quickly.
- The tailstock rack is installed to measure the axel-type parts
- Multiple accessories are provided, with extensive uses.
MIC-JX13C universal computer multipurpose toolmaker’s microscope for image processing
MIC-JX13C universal computer multipurpose toolmaker’s microscope for image processing
Characteristics:
- The imported precision grating system is adopted as the sensory element; with numerous strong points of low heating power, corrosion resistance, pollution resistance, good vibration strength etc.
- The microscope, with powerful image processing software, can complete complicated measuring work, with its software data communicating with CAD to complete the surveying and mapping work.
- The semi-conducting laser as a sensor finder is used for speedily defining the measuring location, thus upgrading the efficiency of image locating.
- The software of digital imaging technology is adopted to automatically identify the outline boundary and to reduce human caused errors, thus upgrading the operational efficiency.
- With a digital display rotary table and a height-measuring device; all measured results of angles and heights can be digitally displayed, direct and convenient.
- The LED cold light source is adopted for the whole lighting device, with low heating power and long life.
- The master microscope can out-beat left and right, suitable for the measurement of helical parts.
