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Microscope prepared slide

All kinds of prepared slides metallurgical prepared slides polarizing prepared slides biological prepared slides plastic prepared slides medical clinical prepared slides
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MIC-TX Portable metallurgical microscope

MIC-TX Portable metallurgical microscope 100X-400X Triple Plan 10X、20X、40X
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MIC-TB Portable metallurgical microscope

MIC-TB Portable metallurgical microscope 100X-400X Triple Plan 10X、20X、40X
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BJ portable metallurgical microscope

MIC TECH BJ-A/BJ-B model is a portable metallurgical microscope, but a little bit different. When metal and alloy which needs to be distinguished but unable to make samples to be used in the on-the-spot material is appraised live, this machine can carry on analysis and research on the metal material in the metallographic testing, and the analytic work of metallographic. It can also be applied to jade article, pottery, bronze ware surface observation of institutional framework analysis. This instrument adopts LED to light vertically, does not need 220V alternating current source, uses lightly and safely for users, hours continuously lighting, long service time. The LED light rises warmly. Very small in size, low heat for safe use. This instrument can dispose CCD digital camera, digital camera, but convenient picture gathered, kept, imported at the scene is analyzed and researched.
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NJ portable microscope

NJ portable microscope Portable Measuring Microscope It is widely used in spot inspecting and measuring in the factory and observation and research in Laboratory. It is especially suitable for production locale inspecting for mechanical, paper making manufacture and print, textile industry, etc. This product is small and exquisite, good designed and exquisite, with easy operation, also suitable for student’s experiment.
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XSZ-YP portable inverted microscope

Small hand-held microscope, simple, good performance, high-definition. Inverted-design is available to observe liquid samples Compact designing, owned power, easy to carry out to take wildlife observation and inspect protozoa in factory effluent and microbiology.
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MIC-ZFA 2010 measurement microscope

MIC-ZFA 2010 measurement microscope with split-image function is independently developed by our company. It is based on image measurement principle, uses detection of optical focal point method to do non-contact height difference measurement. It can not only observe surface states of measured point, but also carry out measurement for height, depth and height difference. This instrument also has ability to observe light and dark file, polarized light, so it is particularly suitable to be used to observe height difference with very little gap、inclusion、protuberance and very little scratches. This product is applicable to detection and observation for silicon wafer、IC、LCD、TFT、PCB、MEMS laser processing、wafer testing、semiconductor material、wiring hardness etching、LCD battery cover、wiring frame product etc.
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MIC-MX12 automatic wafer inspection microscope

MIC TECH’s newly launched MIC-MX12 model five axis full-automatic wafer inspecition microscope is specially designed for large scale electronic component, wafer, epistar, semi-conductor quality checking. With full function such as bright field, dark field, DIC, simple polorizing and other methods, gurantee your high resolution image with sharp contrast. The following is FULL AUTO MIC TECH AWL wafer system based on MIC-MX12 model
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2.7 Inch Portable Digital Microscope

2.7 Inch 544X Magnification 5MP Portable Digital Microscope 3.0 Mega Pixels (2048 X 1536) 5.0 Mega Pixels (2560 X 1920) Hardware Zoom: 17X magnification Smart Zoom TM: 8X (Applying) for magnifier mode Digital Zoom: 1.0X ~32X Total Enlarge image to 544X (17X32=544X)  
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Abbe Refractometer

Abbe Refractometer Measurement of transparent and translucent liquids or solids and the average of the refractive index ND dispersion NF-NC. Equipment can also be received with thermostat, to determination of the temperature 0 ℃ -70 ℃ for the refractive index of ND, and measured the volume of sugar solution concentration in percentage of sugar content.
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VM Series Image Measuring Instrument

VM Series Image Measuring Instrument VM series Image Measuring Instruments are only apply to two-dimensional measurement for the purpose of all applications. Two-dimensional image measurement procedures can be intelligence measurement, simple, powerful, widely used in machinery, electronics, instrumentation, plastics and other industries. Zoom lens system, cross line generator and display as image acquisition and targeting systems, particularly with automatic workpiece edge and put functions.
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JTC300 Digital Projector

JTC300 Digital Projector JTC300 digital projector is a kind of optical measure instrument to measure geometrical elements of tested object in the method of coordinate measuring and figure comparative measuring. It is direct, precise and effective. By the way of transmission and reflection illuminating, it can measure length, angle, figuration and surface of tested parts, especially suitable for examining small or composite parts, such as horologe component, templet, die, knife, etc. Projector is one of common-use instruments in factory, mine, enterprise, measure room, senior academy, and science research. It is equipped with data output interface to contact to computer to carry on corresponding planar measuring program, further convenient to calculate measured data and enlarging use range.