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MIC-SQ600 Measuring Microscope
MIC-SQ600 Measuring Microscope Specification
MIC-SQM-FA Measuring Microscope
MIC-SQ600 Measuring Microscope Specification
MIC-TB Portable metallurgical microscope
MIC-TB Portable metallurgical microscope
100X-400X
Triple Plan 10X、20X、40X
MIC-TX Portable metallurgical microscope
MIC-TX Portable metallurgical microscope
100X-400X
Triple Plan 10X、20X、40X
MIC-TZ1A Eccentricity testing microscope
MIC-TZ1A Eccentricity testing microscope
Internal focusing transmission type centering error inspection system
This microscope is designed for centering of test lenses.
Capable to read with high accuracy for centering of doublet lenses and direction of gap in decentering.
This model is developed having a wider measuring range and easier adjustment in the collimator lens.
Internal focusing transmission type centering error inspection system
This microscope is designed for centering of test lenses.
Use: Can be used to check all kinds of lens which focus is from 5-500mm, good instrument for optical lens making, used for assembly calibrating, test for coaxial deviation between the sphere lens optical axis with the out sphere, especially good for short focus distance hign level lens.
MIC-VM tool microscope
VM serials tool microscope is one smart microscope can be applied in the semi-conductor manufacturing and CCD monitoring.
Long working distance objective, nice calibration for large range of wavelength radiation.
Fiber cable cold light can avoid heating to the samples.
Three kinds of YAG laser light wavelength 1064nm, 532nm, 355nm, can use thin film laser cutting technology in semi-conductor and liquid crystal substrate
Manual or auto is applicable according to customer’s applications.
MIC-WM10 digital microscope system
MIC-WM10 digital microscopy system
Compared with the traditional optical microscope, MIC-WM10 digital microscopy system using high performance optical device and a CCD camera, can be observed on the display screen vivid color images; because the use of digital technology, you can easily make use of the computer and network platform digitizing sample observation, measurement, and processing, etc.
MIC-ZFA 2010 measurement microscope
MIC-ZFA 2010 measurement microscope with split-image function is independently developed by our company. It is based on image measurement principle, uses detection of optical focal point method to do non-contact height difference measurement. It can not only observe surface states of measured point, but also carry out measurement for height, depth and height difference. This instrument also has ability to observe light and dark file, polarized light, so it is particularly suitable to be used to observe height difference with very little gap、inclusion、protuberance and very little scratches.
This product is applicable to detection and observation for silicon wafer、IC、LCD、TFT、PCB、MEMS laser processing、wafer testing、semiconductor material、wiring hardness etching、LCD battery cover、wiring frame product etc.
MIC101 portable video microscope
MIC101 portable video microscope
▲65times amplification, automatic focusing
▲720P high definition microscopic video
▲Unique tripod design
▲Applicable to USB2.0 port of all computer interface
NDX-1 Transmission type centering error inspection system
NDX-1 Transmission type centering error inspection system
This microscope is designed for centering of test lenses.
Capable to read with high accuracy for centering of doublet lenses and direction of gap in decentering.
This model is developed having a wider measuring range and easier adjustment in the collimator lens.
And test all lens with focus distance from -200-+500mm, best choice for optial lens processing and calibration on concentricity deviation between the optical axis of spherical lens and external circle.
NFX-2A Reflection type centering error inspection system
NFX-2A Reflection type centering error inspection system
Description:
This microscope is designed for centering of test lenses.
Capable to read with high accuracy for centering of doublet lenses and direction of gap in decentering.
This model is developed having a wider measuring range and easier adjustment in the collimator lens.
NJ portable microscope
NJ portable microscope
Portable Measuring Microscope
It is widely used in spot inspecting and measuring in the factory and observation and research in Laboratory. It is especially suitable for production locale inspecting for mechanical, paper making manufacture and print, textile industry, etc. This product is small and exquisite, good designed and exquisite, with easy operation, also suitable for student’s experiment.
