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MIC-KS 3D digital microscope
MIC TECH MIC-KS-X1000 serials 3D digital microscope is mainly applied for micro view of sample surface, data test and analysis, different from traditional optical microscope, MIC-KS-X1000 has more depth of field, wider field of view, more magnification, broader viewing angle with better illumination systems.
This machine is widely applied now in intelligent manufacturing, aerospace,military, 3C electronics, semi conductor, automobile, new energy, new materials, pharmaceuticals and other industries.
MIC-MX12 automatic wafer inspection microscope
MIC TECH’s newly launched MIC-MX12 model five axis full-automatic wafer inspecition microscope is specially designed for large scale electronic component, wafer, epistar, semi-conductor quality checking. With full function such as bright field, dark field, DIC, simple polorizing and other methods, gurantee your high resolution image with sharp contrast. The following is FULL AUTO MIC TECH AWL wafer system based on MIC-MX12 model
MIC-SEM6200 Tungsten filament scanning Electron Microscope (Low Vacuum)
High resolution,better image quality
Flip open hairpin tungsten cathode,easy to replace filament
Chinese and English operation menu with one-click image view function
Automatic function: electron gun heating, biasing, alignment, focus, brightness, contrast, astigmation
Auto calibration and malfunction detection
Low maintenance cost
English interface, with one key imaging function
Automatic adjustment function: electron gun heating, bias, alignment, focus, brightness, contrast, dissipate degree, astigmatism and other memories
Low maintenance and repair costs
MIC-SEM6900 Tungsten filament scanning Electron Microscope
High resolution and higher image quality
Pivotal hair fork structure tungsten cathode
English interface, with a key imaging function
Automatic adjustment function: electron gun heating, bias, alignment, focus, brightness, contrast, dissipate degree, astigmatism and other memories
Automatic calibration, automatic fault detection
Low maintenance and repair costs
MIC-SQ600 Measuring Microscope
MIC-SQ600 Measuring Microscope Specification
MIC-SQM-FA Measuring Microscope
MIC-SQ600 Measuring Microscope Specification
MIC-TB Portable metallurgical microscope
MIC-TB Portable metallurgical microscope
100X-400X
Triple Plan 10X、20X、40X
MIC-TX Portable metallurgical microscope
MIC-TX Portable metallurgical microscope
100X-400X
Triple Plan 10X、20X、40X
MIC-TZ1A Eccentricity testing microscope
MIC-TZ1A Eccentricity testing microscope
Internal focusing transmission type centering error inspection system
This microscope is designed for centering of test lenses.
Capable to read with high accuracy for centering of doublet lenses and direction of gap in decentering.
This model is developed having a wider measuring range and easier adjustment in the collimator lens.
Internal focusing transmission type centering error inspection system
This microscope is designed for centering of test lenses.
Use: Can be used to check all kinds of lens which focus is from 5-500mm, good instrument for optical lens making, used for assembly calibrating, test for coaxial deviation between the sphere lens optical axis with the out sphere, especially good for short focus distance hign level lens.
