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MIC-JX14B digital large scale toolmaker’s microscope

MIC-JX14B digital large scale toolmaker’s microscope   Characteristics:
  1. The photoelectrical technique is adopted, with a precision grating rule as a measurer for X- and Y- axis as a measurer, with readings direct-viewing and testing convenient.
  2. With multiple eyepieces and objectives, the main microscope has a large scope of view field with clear image formation
  3. The main microscope can oscillate left and right, suitable for the measurement for spiral pats.
  4. LED-luminotron lighting is adopted for transmission and indirect lighting, with low heating power and long life.
  5. High speed and micro-motion devices are adopted which can be switched over quickly.
  6. The tailstock rack is installed to measure the axel-type parts
  7. Multiple accessories are provided, with extensive uses.
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MIC-JX14B1 digital large scale toolmaker’s microscope

MIC-JX14B1 digital large scale toolmaker’s microscope   Characteristics:
  1. The photoelectrical technique is adopted, with a precision grating rule as a measurer for X- and Y- axis as a measurer, with readings direct-viewing and testing convenient.
  2. The integral digital display box is installed in front of the base frame, consisting of a unified entity with the mainframe; with a simple system easy to operate
  3. With multiple eyepieces and objectives, the main microscope has a large scope of view field with clear image formation
  4. The main microscope can oscillate left and right, suitable for the measurement for spiral pats.
  5. LED-luminotron lighting is adopted for transmission and indirect lighting, with low heating power and long life.
  6. High speed and micro-motion devices are adopted which can be switched over quickly.
  7. The tailstock rack is installed to measure the axel-type parts
  8. Multiple accessories are provided, with extensive uses.
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MIC-JX6 toolmaker’s microscope

MIC-JX6 toolmaker’s microscope This toolmaker’s microscope manufactured by Chongqing MIC Technology Co.,Ltd are divided into large scale and universal toomaker. According to the characteristics of products performance. Toolmaker microscope are divided into various types: those with graduation readout type, or with digital display type, with software processing, with CCD and image software processing and etc. They have high measuring accuracy and can satisfy the requirement of different clients. Toolmaker’s microscope can accurately measure size, angles, forms and positions of various work pieces and varied parameters of the screw-thread manufactured pieces. It is widely used in the measurement and checking services in the sectors of machinery, instrumentation, die equipment manufacturing, instrument and metering, military industry, aviation and aerospace industry and automobile manufacturing, electronics, plastics and rubber etc, or in colleges and universities, research institutes. This instrument with multiple accessories of optical locator, tailstock rack, double-image eyepieces, template eyepieces, etc. Can be used for the quality detection and control for machinery parts, measuring tool, pattern die, electronic elements, circuit board, presswork, plastic and rubber products etc.
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MIC-JX7 Multipurpose toolmaker’s microscope

MIC-JX7 Multipurpose toolmaker’s microscope Characteristics:
  1. The master microscope is equipped with multiple eyepieces and objectives, with large field view and sharp image.
  2. The master microscope can out-beat left and right, suitable for the measurement of helical parts.
  3. The transmission and indirect lighting can measure profile and the surface sizes
  4. High-speed movement and vernier arrangement are installed and can be switched over speedily.
  5. Multiple accessories of tailstock, V-type support, height-measuring device and etc, with wide use range.
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MIC-MX12 automatic wafer inspection microscope

MIC TECH’s newly launched MIC-MX12 model five axis full-automatic wafer inspecition microscope is specially designed for large scale electronic component, wafer, epistar, semi-conductor quality checking. With full function such as bright field, dark field, DIC, simple polorizing and other methods, gurantee your high resolution image with sharp contrast. The following is FULL AUTO MIC TECH AWL wafer system based on MIC-MX12 model
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MIC-SQ600 Measuring Microscope

MIC-SQ600 Measuring Microscope Specification
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MIC-SQM-FA Measuring Microscope

MIC-SQ600 Measuring Microscope Specification
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MIC-TB Portable metallurgical microscope

MIC-TB Portable metallurgical microscope 100X-400X Triple Plan 10X、20X、40X
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MIC-TX Portable metallurgical microscope

MIC-TX Portable metallurgical microscope 100X-400X Triple Plan 10X、20X、40X
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MIC-TZ1A Eccentricity testing microscope

MIC-TZ1A Eccentricity testing microscope Internal focusing transmission type centering error inspection system This microscope is designed for centering of test lenses. Capable to read with high accuracy for centering of doublet lenses and direction of gap in decentering. This model is developed having a wider measuring range and easier adjustment in the collimator lens. Internal focusing transmission type centering error inspection system This microscope is designed for centering of test lenses. Use: Can be used to check all kinds of lens which focus is from 5-500mm, good instrument for optical lens making, used for assembly calibrating, test for coaxial deviation between the sphere lens optical axis with the out sphere, especially good for short focus distance hign level lens.
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MIC-VM tool microscope

VM serials tool microscope is one smart microscope can be applied in the semi-conductor manufacturing and CCD monitoring. Long working distance objective, nice calibration for large range of wavelength radiation. Fiber cable cold light can avoid heating to the samples. Three kinds of YAG laser light wavelength 1064nm, 532nm, 355nm, can use thin film laser cutting technology in semi-conductor and liquid crystal substrate Manual or auto is applicable according to customer’s applications.
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MIC-WM10 digital microscope system

MIC-WM10 digital microscopy system Compared with the traditional optical microscope, MIC-WM10 digital microscopy system using high performance optical device and a CCD camera, can be observed on the display screen vivid color images; because the use of digital technology, you can easily make use of the computer and network platform digitizing sample observation, measurement, and processing, etc.
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MIC-ZFA 2010 measurement microscope

MIC-ZFA 2010 measurement microscope with split-image function is independently developed by our company. It is based on image measurement principle, uses detection of optical focal point method to do non-contact height difference measurement. It can not only observe surface states of measured point, but also carry out measurement for height, depth and height difference. This instrument also has ability to observe light and dark file, polarized light, so it is particularly suitable to be used to observe height difference with very little gap、inclusion、protuberance and very little scratches. This product is applicable to detection and observation for silicon wafer、IC、LCD、TFT、PCB、MEMS laser processing、wafer testing、semiconductor material、wiring hardness etching、LCD battery cover、wiring frame product etc.
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NDX-1 Transmission type centering error inspection system

NDX-1 Transmission type centering error inspection system This microscope is designed for centering of test lenses. Capable to read with high accuracy for centering of doublet lenses and direction of gap in decentering. This model is developed having a wider measuring range and easier adjustment in the collimator lens. And test all lens with focus distance from -200-+500mm, best choice for optial lens processing and calibration on concentricity deviation between the optical axis of spherical lens and external circle.
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NFX-2A Reflection type centering error inspection system

NFX-2A Reflection type centering error inspection system Description: This microscope is designed for centering of test lenses. Capable to read with high accuracy for centering of doublet lenses and direction of gap in decentering. This model is developed having a wider measuring range and easier adjustment in the collimator lens.
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NJ portable microscope

NJ portable microscope Portable Measuring Microscope It is widely used in spot inspecting and measuring in the factory and observation and research in Laboratory. It is especially suitable for production locale inspecting for mechanical, paper making manufacture and print, textile industry, etc. This product is small and exquisite, good designed and exquisite, with easy operation, also suitable for student’s experiment.
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Table style projector 23JA

23JA Table style projector As a non-contacting measuring instrument, Table style projector 23JA can avoid the measurement force to effect the measuring accuracy. The lighting system and objective lens all take use of telecentric optical path, which can make the lighting be well-distributed, and avoid focusing error caused by the elimination of measurement error. The instrument take parts of the test apparatus for transmission profilometry measuring, the objective lens with reflective lighting system can detect the object surface situation and shape, position size. It is also available to detect all kinds of parts with complex surface shape and profile, and for the detection of abrasive and cutting tools. It is especially suitable for the detection of a variety of small and special-shaped parts. It is very convenient for the high-volume use of template contrasting detection.
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Tool 15J Measuring Microscope

15J Measuring Microscope Measurement of optical microscopy is one of the measurement apparatus, it is simple, easy to operate, a very wide scope of application and the main use is as follows: 1. Determination of the length of rectangular coordinates, such as the determination of Distance, distance-based, groove width, keyway width, slit width, diameter cylindrical hole and so on. 2. Determination of angle of rotation dials, such as dial, model, gauge, drilling template and parts of complex geometry for angle measurement. 3. Microscope for observation to compare the surface finishes inspection method, identification of metallurgical industry ore specimens. Test photo-offset printing, testing and so on textile fibers.
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Tool 15JF Digital Measuring Microscope

15JF Digital Measuring Microscope 15 JF measuring microscope (digital display type) is one of the optical measuring instrument, its structure is simple, using direct reading 3 "TFT screen, easy to operate, the applicable scope, main use is as follows:
  1. In the rectangular coordinate measuring length, such as the determination of pitch, base distance, groove width, keyway width, slit width, cylindrical hole diameter, and so on.
  2. Turn the dial measurement point, such as the dial, sample, gauge, borehole Angle measurement module and complex geometry parts.
  3. Used for observation of microscope, for comparison test work surface finish, and rock specimens identification of metallurgical industry. Identification of printing process, inspection of textile fiber, and so on.
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VM Series Image Measuring Instrument

VM Series Image Measuring Instrument VM series Image Measuring Instruments are only apply to two-dimensional measurement for the purpose of all applications. Two-dimensional image measurement procedures can be intelligence measurement, simple, powerful, widely used in machinery, electronics, instrumentation, plastics and other industries. Zoom lens system, cross line generator and display as image acquisition and targeting systems, particularly with automatic workpiece edge and put functions.
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XSZ-YP portable inverted microscope

Small hand-held microscope, simple, good performance, high-definition. Inverted-design is available to observe liquid samples Compact designing, owned power, easy to carry out to take wildlife observation and inspect protozoa in factory effluent and microbiology.
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