MIC-EM6900 Tungsten filament scanning Electron Microscope

High resolution and higher image quality
Pivotal hair fork structure tungsten cathode
English interface, with a key imaging function
Automatic adjustment function: electron gun heating, bias, alignment, focus, brightness, contrast, dissipate degree, astigmatism and other memories
Automatic calibration, automatic fault detection
Low maintenance and repair costs

MIC-EM69 Series Tungsten Filament Scanning Electron Microscope

The MIC-EM69 series scanning electron microscope with excellent imaging wide range of expansion attachments.

Optional low vacuum modules and rich automation functions, various possibility of customization

FEATURES

Simultaneous imaging with different detectors

Dual-channel images display of SE and BSESignal mixing ratio of different detectors can be set freely

BSE detector, to detect the composition characterstics of the sample surface

Dimension measurement

With extensive image measurement functions such as distance, angle, horizontal/vertical line, etc

Particle size analysis

The composite image processing algorithm of deep learning is adopted to automatically identify the proportional scale, accurately identify the particles in the image, and count and export various morphological parameters for more comprehensive particle size and particle shape statistics. (Aluminum-doped cobalt carbonate; Silicon dioxide; Statistical results; Particle size analysis results.

Large image stitching

Automatic planning of the full field of view matrix for the sample area, with no need for manual intervention in the photography process。

Multi functional precision adjustment module

Magnification coarse and fine adjustment, electrical alignment, focus adjustment, anti astigmatism adjustment, brightness and contrast adjustment, potential shift adjustment, etc.